24 search results - page 3 / 5 » A revisit to voltage partitioning problem |
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
TCS
2010
13 years 3 months ago
2010
We study the following variant of the bin packing problem. We are given a set of items, where each item has a (non-negative) size and a color. We are also given an integer paramet...
COCOON
2007
Springer
13 years 9 months ago
2007
Springer
Abstract. We revisit the online unit clustering problem in one dimension which we recently introduced at WAOA'06: given a sequence of n points on the line, the objective is to...
AUTOMATICA
2006
13 years 5 months ago
2006
The challenging problem in linear control theory is to describe the total set of parameters (controller coefficients or plant characteristics) which provide stability of a system....
COMPGEOM
2010
ACM
13 years 10 months ago
2010
ACM
We revisit one of the most fundamental classes of data structure problems in computational geometry: range searching. Back in SoCG’92, Matouˇsek gave a partition tree method fo...