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ICCAD
2002
IEEE
176views Hardware» more  ICCAD 2002»
14 years 2 months ago
High capacity and automatic functional extraction tool for industrial VLSI circuit designs
In this paper we present an advanced functional extraction tool for automatic generation of high-level RTL from switch-level circuit netlist representation. The tool is called FEV...
Sasha Novakovsky, Shy Shyman, Ziyad Hanna
ICCAD
2006
IEEE
124views Hardware» more  ICCAD 2006»
14 years 2 months ago
Simultaneous power and thermal integrity driven via stapling in 3D ICs
The existing work on via-stapling in 3D integrated circuits optimizes power and thermal integrity separately and uses steadystate thermal analysis. This paper presents the first ...
Hao Yu, Joanna Ho, Lei He
DFT
1999
IEEE
131views VLSI» more  DFT 1999»
13 years 10 months ago
Optimal Vector Selection for Low Power BIST
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...
Fulvio Corno, Matteo Sonza Reorda, Maurizio Rebaud...
ICDCS
2007
IEEE
14 years 3 days ago
STEP: Sequentiality and Thrashing Detection Based Prefetching to Improve Performance of Networked Storage Servers
State-of-the-art networked storage servers are equipped with increasingly powerful computing capability and large DRAM memory as storage caches. However, their contribution to the...
Shuang Liang, Song Jiang, Xiaodong Zhang
TC
2008
13 years 5 months ago
Low-Transition Test Pattern Generation for BIST-Based Applications
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed