2 search results - page 1 / 1 » A step by step methodology to analyze the IGBT failure mecha... |
MR
2007
13 years 4 months ago
2007
A systematic methodology is developed in order to clarify the punch through Trench Insulated Gate Bipolar Transistor (T-IGBT) failure mechanisms which can occur under extreme oper...
MR
2006
13 years 5 months ago
2006
Power semiconductor devices under short-circuit are submitted to high current and high voltage simultaneously that induce high electrical and thermal stresses. Several types of ev...