1215 search results - page 1 / 243 » A theory of Error-Rate Testing |
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...
DATE
2008
IEEE
13 years 10 months ago
2008
IEEE
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
PAMI
1998
13 years 4 months ago
1998
—We address the problem of determining what size test set guarantees statistically significant results in a character recognition task, as a function of the expected error rate. ...
IOLTS
2007
IEEE
13 years 10 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
FPGA
2005
ACM
13 years 9 months ago
2005
ACM
FPGA-based designs are more susceptible to single-event upsets (SEUs) compared to ASIC designs. Soft error rate (SER) estimation is a crucial step in the design of soft error tole...