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PKDD
2010
Springer
212views Data Mining» more  PKDD 2010»
13 years 3 months ago
Cross Validation Framework to Choose amongst Models and Datasets for Transfer Learning
Abstract. One solution to the lack of label problem is to exploit transfer learning, whereby one acquires knowledge from source-domains to improve the learning performance in the t...
ErHeng Zhong, Wei Fan, Qiang Yang, Olivier Versche...
RTAS
2010
IEEE
13 years 3 months ago
Using PCM in Next-generation Embedded Space Applications
Abstract--Dynamic RAM (DRAM) has been the best technology for main memory for over thirty years. In embedded space applications, radiation hardened DRAM is needed because gamma ray...
Alexandre Peixoto Ferreira, Bruce R. Childers, Ram...