6 search results - page 2 / 2 » AES-Based BIST: Self-Test, Test Pattern Generation and Signa... |
VLSID
2001
IEEE
14 years 5 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...