19 search results - page 4 / 4 » ARTOO: adaptive random testing for object-oriented software |
ISSTA
2006
ACM
13 years 10 months ago
2006
ACM
There are several problem areas that must be addressed when applying randomization to unit testing. As yet no general, fully automated solution that works for all units has been p...
VTS
1997
IEEE
13 years 8 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
ECOOP
2008
Springer
13 years 6 months ago
2008
Springer
Good data layouts improve cache and TLB performance of object-oriented software, but unfortunately, selecting an optimal data layout a priori is NP-hard. This paper introduces layo...
TASE
2008
IEEE
13 years 4 months ago
2008
IEEE
This paper addresses the general single-machine earliness-tardiness problem with distinct release dates, due dates, and unit costs. The aim of this research is to obtain an exact n...