8 search results - page 2 / 2 » ATPG for Heat Dissipation Minimization During Scan Testing |
VTS
2006
IEEE
13 years 11 months ago
2006
IEEE
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
VTS
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...