15 search results - page 3 / 3 » Address and Data Scrambling: Causes and Impact on Memory Tes... |
BMCBI
2011
13 years 8 days ago
2011
Background: High-throughput screening (HTS) is a key part of the drug discovery process during which thousands of chemical compounds are screened and their activity levels measure...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
Transient errors are one of the major reasons for system downtime in many systems. While prior research has mainly focused on the impact of transient errors on datapath, caches an...
EMSOFT
2005
Springer
13 years 10 months ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...