3 search results - page 1 / 1 » Addressing the Metric Challenge: Evolved versus Traditional ... |
AHS
2007
IEEE
13 years 11 months ago
2007
IEEE
The field of Evolvable Hardware, applying artificial evolution to the design of digital and analogue hardware is around ten years old. However, the field is far from reaching m...
AHS
2007
IEEE
13 years 6 months ago
2007
IEEE
Fault Tolerance is an increasing challenge for integrated circuits due to semiconductor technology scaling. This paper looks at how artificial evolution may be tuned to the creat...
HPCA
2006
IEEE
14 years 5 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...