17 search results - page 1 / 4 » An Algebra of Scans |
ICCD
2003
IEEE
13 years 10 months ago
2003
IEEE
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...
MPC
2004
Springer
13 years 10 months ago
2004
Springer
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
We describe a technique to generate critical hazard-free tests for self-timed control circuits build using a macromodule library, in a partial scan based DFT environment. Wepropos...
MICCAI
2006
Springer
14 years 5 months ago
2006
Springer
In medical imaging, parameterized 3D surface models are of great interest for anatomical modeling and visualization, statistical comparisons of anatomy, and surface-based registrat...
ISBI
2007
IEEE
13 years 11 months ago
2007
IEEE
In limited data tomography, with applications such as electron microscopy, medical imaging, industrial non-destructive testing, etc., the scanning views are within an angular rang...