3 search results - page 1 / 1 » An Analysis of Microarchitecture Vulnerability to Soft Error... |
ISPASS
2007
IEEE
13 years 10 months ago
2007
IEEE
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
ICPP
2008
IEEE
13 years 10 months ago
2008
IEEE
The issue queue (IQ) is a key microarchitecture structure for exploiting instruction-level and thread-level parallelism in dynamically scheduled simultaneous multithreaded (SMT) p...
ISCA
2007
IEEE
13 years 10 months ago
2007
IEEE
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...