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DDECS
2007
IEEE
143views Hardware» more  DDECS 2007»
13 years 11 months ago
An Experimental Analysis of SEU Sensitiveness on System Knowledge-based Hardening Techniques
Logic Soft Errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft ...
Oscar Ruano, Pilar Reyes, Juan Antonio Maestro, Lu...
DATE
2010
IEEE
168views Hardware» more  DATE 2010»
13 years 10 months ago
A new placement algorithm for the mitigation of multiple cell upsets in SRAM-based FPGAs
Modern FPGAs have been designed with advanced integrated circuit techniques that allow high speed and low power performance, joined to reconfiguration capabilities. This makes new...
Luca Sterpone, Niccolò Battezzati