A significant fraction of soft errors in modern microprocessors has been reported to never lead to a system failure. Any concurrent error detection scheme that raises alarm every ...
Abstract. We present our experience of combining, in a realistic setting, a static analyzer with a statistical analysis. This combination is in order to reduce the inevitable false...
Yungbum Jung, Jaehwang Kim, Jaeho Shin, Kwangkeun ...
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
When program verification tools fail to verify a program, either the program is buggy or the report is a false alarm. In this situation, the burden is on the user to manually cla...
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...
Avi Timor, Avi Mendelson, Yitzhak Birk, Neeraj Sur...