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» An Integrated Built-In Test and Repair Approach for Memories...
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ETS
2007
IEEE
94views Hardware» more  ETS 2007»
13 years 10 months ago
An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
ITC
2003
IEEE
168views Hardware» more  ITC 2003»
13 years 9 months ago
A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...
Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen ...
DDECS
2007
IEEE
175views Hardware» more  DDECS 2007»
13 years 10 months ago
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
ASPLOS
2006
ACM
13 years 9 months ago
Ultra low-cost defect protection for microprocessor pipelines
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
Smitha Shyam, Kypros Constantinides, Sujay Phadke,...