In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Background: Assessment of array quality is an essential step in the analysis of data from microarray experiments. Once detected, less reliable arrays are typically excluded or &qu...
Matthew E. Ritchie, Dileepa S. Diyagama, Jody Neil...
The traditional approach to building Bayesian networks is to build the graphical structure using a graphical editor and then add probabilities using a separate spreadsheet for eac...
We present a near-optimal reduction from approximately counting the cardinality of a discrete set to approximately sampling elements of the set. An important application of our wo...
Abstract. We study the natural problem of secure n-party computation (in the passive, computationally unbounded attack model) of the n-product function fG(x1, . . . , xn) = x1 · x...
Yvo Desmedt, Josef Pieprzyk, Ron Steinfeld, Huaxio...