913 search results - page 1 / 183 » An Optimal Algorithm for the Automatic Generation of March T... |
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper presents an innovative algorithm for the automatic generation of March Tests. The proposed approach is able to generate an optimal March Test for an unconstrained set o...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and m...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
GECCO
2007
Springer
13 years 11 months ago
2007
Springer
Fault-based testing is often advocated to overcome limitations of other testing approaches; however it is also recognized as being expensive. On the other hand, evolutionary algor...
DATE
1998
IEEE
13 years 9 months ago
1998
IEEE
Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....