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ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
13 years 10 months ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
GECCO
2009
Springer
209views Optimization» more  GECCO 2009»
13 years 10 months ago
MC/DC automatic test input data generation
Zeina Awedikian, Kamel Ayari, Giuliano Antoniol
TACAS
2009
Springer
122views Algorithms» more  TACAS 2009»
14 years 1 days ago
Test Input Generation for Programs with Pointers
Software testing is an essential process to improve software quality in practice. Researchers have proposed several techniques to automate parts of this process. In particular, sym...
Dries Vanoverberghe, Nikolai Tillmann, Frank Piess...
VLSID
2009
IEEE
150views VLSI» more  VLSID 2009»
14 years 5 months ago
TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis...
GECCO
2003
Springer
148views Optimization» more  GECCO 2003»
13 years 10 months ago
Structural and Functional Sequence Test of Dynamic and State-Based Software with Evolutionary Algorithms
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...
André Baresel, Hartmut Pohlheim, Sadegh Sad...