22 search results - page 5 / 5 » An efficient automatic test generation system for path delay... |
ISLPED
2007
ACM
13 years 6 months ago
2007
ACM
Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
— With increasing reliability concerns for current and next generation VLSI technologies, fault-tolerance is fast becoming an integral part of system-on-chip (SoC) and multicore ...