12 search results - page 1 / 3 » An experimental analysis of spot defects in SRAMs: realistic... |
ATS
2000
IEEE
13 years 9 months ago
2000
IEEE
: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...
EURODAC
1995
IEEE
13 years 8 months ago
1995
IEEE
The presented fault model uniquely describes all structural changes in the transistor net list that can be caused by spot defects, including faults that connect more than two nets...
GLVLSI
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
DFT
2003
IEEE
13 years 9 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
ET
2007
13 years 4 months ago
2007
In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...