72 search results - page 1 / 15 » An improved RF loopback for test time reduction |
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
In this work a method to improve the loopback test used in RF analog circuits is described. The approach is targeted to the SoC environment, being able to reuse system resources i...
ET
2010
13 years 3 months ago
2010
Modern mixed-signal/RF circuits with a digital calibration capability could achieve significant performance improvement through calibration. However, the calibration process often ...
ISCAS
2002
IEEE
13 years 10 months ago
2002
IEEE
CONEXT
2008
ACM
13 years 7 months ago
2008
ACM
Increased AP density in enterprise WLANs leads to increasing RF interference and decreasing performance. An important step towards mitigating this problem is to construct precise ...
MTV
2007
IEEE
14 years 18 hour ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...