85 search results - page 2 / 17 » Analysis and Detection of Timing Failures in an Experimental... |
ICCD
1999
IEEE
13 years 9 months ago
1999
IEEE
High resistance bridges (resistive bridges) are becoming more common. Such bridges cause speed failures. Published experimental results show that current tests are not good at det...
KDD
2000
ACM
13 years 8 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
ISMVL
2007
IEEE
13 years 11 months ago
2007
IEEE
The clock rate of modern chips is still increasing and at the same time the gate size decreases. As a result, already slight variations during the production process may cause a f...
ICCD
2002
IEEE
13 years 10 months ago
2002
IEEE
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic desi...
KBSE
2005
IEEE
13 years 10 months ago
2005
IEEE
User-session-based testing of web applications gathers user sessions to create and continually update test suites based on real user input in the field. To support this approach ...