3 search results - page 1 / 1 » Analysis and Test of Resistive-Open Defects in SRAM Pre-Char... |
ET
2007
13 years 4 months ago
2007
In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
MTDT
2003
IEEE
13 years 9 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...