13 search results - page 1 / 3 » Analysis of Performance Impact Caused by Power Supply Noise ... |
DAC
1999
ACM
14 years 5 months ago
1999
ACM
DAC
1997
ACM
13 years 8 months ago
1997
ACM
This paper describes a new design methodology to analyze the on-chip power supply noise for high performance microprocessors. Based on an integrated package-level and chip-level p...
VTS
2000
IEEE
13 years 8 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
VTS
2007
IEEE
13 years 10 months ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...