67 search results - page 2 / 14 » Analysis of multibackground memory testing techniques |
PLDI
1994
ACM
13 years 10 months ago
1994
ACM
As microprocessor speeds increase, memory bandwidth is increasing y the performance bottleneck for microprocessors. This has occurred because innovation and technological improvem...
VLSID
2001
IEEE
14 years 6 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
DATE
2003
IEEE
13 years 11 months ago
2003
IEEE
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...
ICST
2008
IEEE
14 years 22 days ago
2008
IEEE
Flash memory has become virtually indispensable in most mobile devices, such as mobile phones, digital cameras, mp3 players, etc. In order for mobile devices to successfully provi...
SP
2008
IEEE
14 years 21 days ago
2008
IEEE
Attacks often exploit memory errors to gain control over the execution of vulnerable programs. These attacks remain a serious problem despite previous research on techniques to pr...