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ICCAD
2005
IEEE
87views Hardware» more  ICCAD 2005»
14 years 2 months ago
Statistical technology mapping for parametric yield
The increasing variability of process parameters leads to substantial parametric yield losses due to timing and leakage power constraints. Leakage power is especially affected by ...
Ashish Kumar Singh, Murari Mani, Michael Orshansky
CADE
2009
Springer
14 years 5 months ago
Real World Verification
Scalable handling of real arithmetic is a crucial part of the verification of hybrid systems, mathematical algorithms, and mixed analog/digital circuits. Despite substantial advanc...
André Platzer, Jan-David Quesel, Philipp R&...