Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
The rapid changing business environment of high-tech asset intensive enterprises such as semiconductor manufacturing constantly drives production managers to look for better solut...
Malcolm Yoke-Hean Low, Kong Wei Lye, Peter Lenderm...
Using simulated data to develop and study diagnostic tools for data analysis is very beneficial. The user can gain insight about what happens when assumptions are violated since t...
This paper presents a novel distributed framework for multi-target tracking with an efficient data association computation. A decentralized representation of trackers' motion...