8 search results - page 1 / 2 » Applying Defect-Based Test to Embedded Memories in a COT Mod... |
MTDT
2003
IEEE
13 years 9 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
MTDT
2002
IEEE
13 years 9 months ago
2002
IEEE
The amount of memory being embedded on chip is growing rapidly. This strongly implies that memory Built-in-self-test (BIST) logic assumes utmost importance amongst all on chip sel...
KBSE
2008
IEEE
13 years 10 months ago
2008
IEEE
Flash memory has become virtually indispensable in most mobile devices. In order for mobile devices to successfully provide services to users, it is essential that flash memory b...
TSE
2011
12 years 11 months ago
2011
—Conventional testing methods often fail to detect hidden flaws in complex embedded software such as device drivers or file systems. This deficiency incurs significant developmen...
SBMF
2009
Springer
13 years 11 months ago
2009
Springer
In today’s information society, flash memory has become a virtually indispensable component, particularly for mobile devices. In order for mobile devices to operate successfully...