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VLSID
2006
IEEE
129views VLSI» more  VLSID 2006»
14 years 6 months ago
A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasma...
TOG
2008
141views more  TOG 2008»
13 years 5 months ago
Simulating knitted cloth at the yarn level
Knitted fabric is widely used in clothing because of its unique and stretchy behavior, which is fundamentally different from the behavior of woven cloth. The properties of knits c...
Jonathan M. Kaldor, Doug L. James, Steve Marschner