27 search results - page 1 / 6 » Architecting processors to allow voltage reliability tradeof... |
CASES
2011
ACM
12 years 4 months ago
2011
ACM
Escalating variations in modern CMOS designs have become a threat to Moore’s law. While previous works have proposed techniques for tolerating variations by trading reliability ...
DSN
2005
IEEE
13 years 10 months ago
2005
IEEE
Register files are in the critical path of most high-performance processors and their latency is one of the most important factors that limit their size. Our goal is to develop er...
DSN
2008
IEEE
13 years 10 months ago
2008
IEEE
As semiconductor technology scales, reliability is becoming an increasingly crucial challenge in microprocessor design. The rSRAM and voltage scaling are two promising circuit-lev...
MICRO
2010
IEEE
13 years 2 months ago
2010
IEEE
Soft error reliability is increasingly becoming a first-order design concern for microprocessors, as a result of higher transistor counts, shrinking device geometries and lowering ...
ISLPED
2003
ACM
13 years 9 months ago
2003
ACM
Enabled by the continuous advancement in fabrication technology, present day synchronous microprocessors include more than 100 million transistors and have clock speeds well in ex...