17 search results - page 2 / 4 » Architecture and circuit techniques for low-throughput, ener... |
MICRO
2003
IEEE
13 years 9 months ago
2003
IEEE
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Techniques to deal with these transient faults exist, but come at a cost. Designers...
CODES
2008
IEEE
13 years 4 months ago
2008
IEEE
With power becoming a major constraint for multi-processor embedded systems, it is becoming important for designers to characterize and model processor power dissipation. It is cr...
DAC
2006
ACM
13 years 10 months ago
2006
ACM
duce system weight and volume, increase operating lifetime, The recent explosion in capability of embedded and portable decrease maintenance costs, and open new frontiers for inele...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
DAC
1994
ACM
13 years 8 months ago
1994
ACM
Today's high-performance single-chip CMOS microprocessors are the most complex and challenging chip designs ever implemented. To stay on the leading edge, Digital's micro...