4 search results - page 1 / 1 » Automated Assembly Inspection Using a Multiscale Algorithm T... |
ICRA
1994
IEEE
13 years 8 months ago
1994
IEEE
BMVC
2001
13 years 7 months ago
2001
This paper presents an inspection method of particle contamination for semiconductor reticles using continuous wavelet transform. Particle defect is considered as a singularity in...
VIP
2003
13 years 6 months ago
2003
Using different algorithms to segment different images is a quite straightforward strategy for automated image segmentation. But the difficulty of the optimal algorithm selection ...
MIRAGE
2009
Springer
13 years 11 months ago
2009
Springer
Abstract. We present a fast and robust iterative method for interpreting face images under non-uniform lighting conditions by using a fitting algorithm which utilizes an illuminat...