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» Automated Modeling of Custom Digital Circuits for Test
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DAC
2003
ACM
14 years 6 months ago
Death, taxes and failing chips
In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important as...
Chandu Visweswariah
CL
2000
Springer
13 years 10 months ago
Modelling Digital Circuits Problems with Set Constraints
A number of diagnostic and optimisation problems in Electronics Computer Aided Design have usually been handled either by specific tools or by mapping them into a general problem s...
Francisco Azevedo, Pedro Barahona
DSD
2008
IEEE
85views Hardware» more  DSD 2008»
14 years 7 days ago
TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...
Josef Strnadel
ISQED
2005
IEEE
169views Hardware» more  ISQED 2005»
13 years 11 months ago
ASLIC: A Low Power CMOS Analog Circuit Design Automation
This paper proposes an efficient automation platform that provides fast and reliable path to analog circuit design for desired specifications. Circuit heuristics and hierarchy a...
Jihyun Lee, Yong-Bin Kim
ICCAD
2000
IEEE
171views Hardware» more  ICCAD 2000»
13 years 10 months ago
A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
Michael Pronath, Volker Gloeckel, Helmut E. Graeb