Sciweavers

2 search results - page 1 / 1
» Automated and Scalable T-wise Test Case Generation Strategie...
Sort
View
ICST
2010
IEEE
13 years 3 months ago
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit ...
ICST
2010
IEEE
13 years 2 months ago
Automated Test Data Generation on the Analyses of Feature Models: A Metamorphic Testing Approach
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...
Sergio Segura, Robert M. Hierons, David Benavides,...