106 search results - page 1 / 22 » Automated data analysis solutions to silicon debug |
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
ISQED
2010
IEEE
13 years 9 months ago
2010
IEEE
Abstract—Silicon debug poses a unique challenge to the engineer because of the limited access to internal signals of the chip. Embedded hardware such as trace buffers helps overc...
ATS
2010
IEEE
13 years 2 months ago
2010
IEEE
One of the most challenging problems in post-silicon validation is to identify those errors that cause prohibitive extra delay on speedpaths in the circuit under debug (CUD) and o...
DAC
2006
ACM
13 years 10 months ago
2006
ACM
Several emerging Design-for-Debug (DFD) methodologies are addressing silicon debug by making internal signal values and other data observable. Most of these methodologies require ...
DAC
2004
ACM
14 years 5 months ago
2004
ACM
Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpo...