13 search results - page 1 / 3 » Automated silicon debug data analysis techniques for a hardw... |
ISQED
2010
IEEE
13 years 9 months ago
2010
IEEE
Abstract—Silicon debug poses a unique challenge to the engineer because of the limited access to internal signals of the chip. Embedded hardware such as trace buffers helps overc...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
DATE
2008
IEEE
13 years 10 months ago
2008
IEEE
When searching for functional bugs in silicon, debug data is acquired after a trigger event occurs. A trigger event can be configured at run-time using a set of control registers...
DATE
2003
IEEE
13 years 9 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
CAV
2007
Springer
13 years 10 months ago
2007
Springer
We present new techniques for fast, accurate and scalable static data race detection in concurrent programs. Focusing our analysis on Linux device drivers allowed us to identify th...