5 search results - page 1 / 1 » Automatic Test Bench Generation for Validation of RT-Level D... |
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
ATS
2003
IEEE
13 years 9 months ago
2003
IEEE
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
ICST
2008
IEEE
13 years 11 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
RSP
2003
IEEE
13 years 9 months ago
2003
IEEE
Model-based testing relies on the use of behavior models to automatically generate sequences of inputs and expected outputs. These sequences can be used as test cases to the end o...
ASPDAC
2009
ACM
13 years 11 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...