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ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
9 years 8 months ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
DAC
2005
ACM
10 years 4 months ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
DAC
2007
ACM
10 years 4 months ago
Automatic Verification of External Interrupt Behaviors for Microprocessor Design
Interrupt behaviors, especially the external ones, are difficult to verify in a microprocessor design project in that they involve both interacting hardware and software. This pap...
Fu-Ching Yang, Wen-Kai Huang, Ing-Jer Huang
DATE
2004
IEEE
174views Hardware» more  DATE 2004»
9 years 7 months ago
Graph-Based Functional Test Program Generation for Pipelined Processors
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
Prabhat Mishra, Nikil Dutt
DATE
2009
IEEE
136views Hardware» more  DATE 2009»
9 years 10 months ago
A novel approach to entirely integrate Virtual Test into test development flow
– In this paper, we present an open architecture Virtual Test Environment (VTE) which can be easily integrated into various modularized Automatic Test Systems (ATS) compliant to ...
Ping Lu, Daniel Glaser, Gürkan Uygur, Klaus H...
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