17 search results - page 2 / 4 » Automatic Test Program Generation from RT-Level Microprocess... |
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
– In this paper, we present an open architecture Virtual Test Environment (VTE) which can be easily integrated into various modularized Automatic Test Systems (ATS) compliant to ...
MICRO
2009
IEEE
13 years 11 months ago
2009
IEEE
Building an optimising compiler is a difficult and time consuming task which must be repeated for each generation of a microprocessor. As the underlying microarchitecture changes...
FCCM
2006
IEEE
13 years 10 months ago
2006
IEEE
Current Radio Frequency Identification (RFID) systems generally have long design times and low tolerance to changes in specification. This paper describes a field programmable,...
ASPLOS
2004
ACM
13 years 10 months ago
2004
ACM
Embedded software must meet conflicting requirements such as being highly reliable, running on resource-constrained platforms, and being developed rapidly. Static program analysi...
TOOLS
1992
IEEE
13 years 8 months ago
1992
IEEE
This paper describes an Ei el system for rapid testing of grammars. Grammars are de ned in an extended BNF notation that allows actions on the parse tree nodes to be de ned as add...