30 search results - page 1 / 6 » Automatic generation of breakpoint hardware for silicon debu... |
DAC
2004
ACM
14 years 5 months ago
2004
ACM
Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpo...
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— This paper presents techniques that enhance automatically generated hardware assertion checkers to facilitate debugging within the assertion-based verification paradig...
DATE
2008
IEEE
13 years 10 months ago
2008
IEEE
When searching for functional bugs in silicon, debug data is acquired after a trigger event occurs. A trigger event can be configured at run-time using a set of control registers...
ETS
2007
IEEE
13 years 10 months ago
2007
IEEE
— The growth in System-on-Chip complexity puts pressure on system verification. Due to limitations in the pre-silicon verification process, errors in hardware and software slip...
AADEBUG
2005
Springer
13 years 10 months ago
2005
Springer
Reprogrammable hardware systems are traditionally very difficult to debug due to their high level of parallelism. In our solution to this problem, features are inserted into the u...