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ITC
1998
IEEE
95views Hardware» more  ITC 1998»
13 years 8 months ago
Native mode functional test generation for processors with applications to self test and design validation
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
Jian Shen, Jacob A. Abraham
TC
1998
13 years 4 months ago
Abstraction Techniques for Validation Coverage Analysis and Test Generation
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...
GLVLSI
2008
IEEE
157views VLSI» more  GLVLSI 2008»
13 years 11 months ago
Coverage-driven automatic test generation for uml activity diagrams
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
Mingsong Chen, Prabhat Mishra, Dhrubajyoti Kalita
PDSE
1998
126views more  PDSE 1998»
13 years 5 months ago
Validation and Test Generation for Object-Oriented Distributed Software
The development of correct OO distributed software is a daunting task as soon as the distributed interactions are not trivial. This is due to the inherent complexity of distribute...
Thierry Jéron, Jean-Marc Jézé...
ATS
2003
IEEE
98views Hardware» more  ATS 2003»
13 years 9 months ago
Automatic Design Validation Framework for HDL Descriptions via RTL ATPG
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
Liang Zhang, Michael S. Hsiao, Indradeep Ghosh