2 search results - page 1 / 1 » BISD: Scan-based Built-In self-diagnosis |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
ETS
2011
IEEE
12 years 5 months ago
2011
IEEE
—In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional ...