12 search results - page 2 / 3 » BPEL4WS Unit Testing: Test Case Generation Using a Concurren... |
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
TAP
2008
Springer
13 years 5 months ago
2008
Springer
Pex automatically produces a small test suite with high code coverage for a .NET program. To this end, Pex performs a systematic program analysis (using dynamic symbolic execution,...
IFIP
2010
Springer
12 years 12 months ago
2010
Springer
Concurrent software is difficult to verify. Because the thread schedule is not controlled by the application, testing may miss defects that occur under specific thread schedules. T...
PASTE
2010
ACM
13 years 10 months ago
2010
ACM
Multicore is now the dominant processor trend, and the number of cores is rapidly increasing. The paradigm shift to multicore forces the redesign of the software stack, which incl...
SEKE
2005
Springer
13 years 10 months ago
2005
Springer
Design combinatorial theory for test-case generation has been used successfully in the past. It is useful in optimizing test cases as it is practically impossible to exhaustively t...