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ISPD
2007
ACM
151views Hardware» more  ISPD 2007»
13 years 5 months ago
Pattern sensitive placement for manufacturability
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
Shiyan Hu, Jiang Hu
ICDT
2010
ACM
205views Database» more  ICDT 2010»
13 years 9 months ago
On the Aggregation Problem for Synthesized Web Services
The paper formulates and investigates the aggregation problem for synthesized mediators of Web services (SWMs). An SWM is a finite-state transducer defined in terms of templates...
Ting Deng, Wenfei Fan, Leonid Libkin, Yinghui Wu
DEXA
2004
Springer
103views Database» more  DEXA 2004»
13 years 9 months ago
Characterizing Database User's Access Patterns
Much work has been done on characterizing the workload of a database system. Previous studies focused on providing different types of statistical summaries, and modeling the run-ti...
Qingsong Yao, Aijun An
PR
2011
12 years 11 months ago
A sum-over-paths extension of edit distances accounting for all sequence alignments
This paper introduces a simple Sum-over-Paths (SoP) formulation of string edit distances accounting for all possible alignments between two sequences, and extends related previous...
Silvia García-Díez, François ...