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ISCA
2000
IEEE
99views Hardware» more  ISCA 2000»
13 years 9 months ago
Transient fault detection via simultaneous multithreading
Smaller feature sizes, reduced voltage levels, higher transistor counts, and reduced noise margins make future generations of microprocessors increasingly prone to transient hardw...
Steven K. Reinhardt, Shubhendu S. Mukherjee