2 search results - page 1 / 1 » CONCERT: a concurrent transient fault simulator for nonlinea... |
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a novel concurrent fault simulator (called CONCERT) for nonlinear analog circuits. Three primary techniques in CONCERT, including fault ordering, state predict...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...