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» Calculating BPEL Test Coverage Through Instrumentation
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ICCAD
2006
IEEE
126views Hardware» more  ICCAD 2006»
14 years 2 months ago
Exploring linear structures of critical path delay faults to reduce test efforts
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...
Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou
TMI
2010
206views more  TMI 2010»
13 years 14 days ago
Random Subspace Ensembles for fMRI Classification
Classification of brain images obtained through functional magnetic resonance imaging (fMRI) poses a serious challenge to pattern recognition and machine learning due to the extrem...
Ludmila I. Kuncheva, Juan José Rodrí...