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PRL
2008
85views more  PRL 2008»
13 years 5 months ago
Reliability estimation of a statistical classifier
Pattern classification techniques derived from statistical principles have been widely studied and have proven powerful in addressing practical classification problems. In real-wo...
Pandu Ranga Rao Devarakota, Bruno Mirbach, Bjö...
ICDE
2006
IEEE
160views Database» more  ICDE 2006»
14 years 7 months ago
Surface k-NN Query Processing
A k-NN query finds the k nearest-neighbors of a given point from a point database. When it is sufficient to measure object distance using the Euclidian distance, the key to effici...
Ke Deng, Xiaofang Zhou, Heng Tao Shen, Kai Xu 0003...
ISPD
1998
ACM
89views Hardware» more  ISPD 1998»
13 years 10 months ago
Filling and slotting: analysis and algorithms
In very deep-submicron VLSI, certain manufacturing steps – notably optical exposure, resist development and etch, chemical vapor deposition and chemical-mechanical polishing (CM...
Andrew B. Kahng, Gabriel Robins, Anish Singh, Huij...