38 search results - page 8 / 8 » Call Stack Coverage for Test Suite Reduction |
DT
2000
13 years 5 months ago
2000
Effective high-level ATPG tools are increasingly needed, as an essential element in the quest for reducing as much as possible the designer work on gate-level descriptions. We pro...
SIGSOFT
2006
ACM
14 years 6 months ago
2006
ACM
Recent software systems usually feature an automated failure reporting system, with which a huge number of failing traces are collected every day. In order to prioritize fault dia...
DAC
2010
ACM
13 years 9 months ago
2010
ACM
The ever increasing die area of Chip Multiprocessors (CMPs) affects manufacturing yield, resulting in higher manufacture cost. Meanwhile, network-on-chip (NoC) has emerged as a p...