Sciweavers

2 search results - page 1 / 1
» Care Bit Density and Test Cube Clusters: Multi-Level Compres...
Sort
View
ICCD
2003
IEEE
145views Hardware» more  ICCD 2003»
14 years 17 days ago
Care Bit Density and Test Cube Clusters: Multi-Level Compression Opportunities
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...
Bernd Könemann
ATS
2003
IEEE
76views Hardware» more  ATS 2003»
13 years 9 months ago
STAGE: A Decoding Engine Suitable for Multi-Compressed Test Data
: Most of the recently discussed test stimulus data compression techniques are based on the low care bit densities found in typical scan test vectors. Data reduction primarily is a...
Bernd Koenemann